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Netlist Assurance Test Methods exist to assess microcircuit designs for maliciously added, removed, or modified functions detrimental to system operation. In the context of the Microcircuit fabrication design process, these methods will be used to analyze a computer aided design (CAD) representation of the microcircuit. The Netlist Assurance Test Methods discover vulnerabilities, undisclosed functions (e.g. "kill switch", paths to leak passwords, or triggers of malicious activity) and changes from the original specifications of the devices. These methods are intended to be used with standard verification methods that the implemented design has remained unchanged through the many transformations in the design flow.

Non-conformance and now Suspect counterfeit packaging represents a hazard to electrostatic discharge (ESD) sensitive devices or components through cross contamination during transport and storage while generating high voltage discharges to ESD sensitive devices during in shipping, the inspection process, handling and manufacturing. Several aerospace related issues involve long-term storage supplier non-conformance with antistatic foams, antistatic bubble, antistatic pink poly, vacuum formed antistatic polymers, Type I moisture barrier bags and Type III static shielding bags have posed issues. The late John Kolyer, Ph.D. (Boeing, Ret.) and Ray Gompf, P.E., Ph.D. (NASA-KSC, Ret.) were advocates in the utilization of a formalized physical testing material qualification process. Today, however, prime contractors and CMs rely heavily upon a visual inspection process for ESD packaging materials.

This document defines capabilities and limitations of LSM and CLSM as they pertain to suspect/counterfeit EEE part detection. Additionally, this document outlines requirements associated with the application of LSM and CLSM including: operator training, sample preparation, various imaging techniques, data interpretation, calibration, and reporting of test results. This test method is primarily directed to analyses performed in the visible to near infrared range (approximately 400nm to 1100nm). The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the LSM and CLSM Test Methods as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 Scope statement, the specific method being accredited to: Option 1: All AS6171/17 Test Methods, or Option 2: All AS6171/17 Test Methods except CLSM. If SAE AS6171/17 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

This document defines the capabilities and limitations of SIMS as they pertain to Suspect/Counterfeit EEE part detection. Additionally, this document outlines requirements associated with the application of SIMS including: operator training, sample preparation, data interpretation, equipment maintenance, and reporting of data. The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the SIMS Test Method as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 scope statement the specific method being accredited to: Option 1: All AS6171/13 Test Methods, or Option 2: All AS6171/13 Test Methods except 2D Imaging and 3D Imaging, or Option 3: All AS6171/13 Test Methods except Depth Profiling and 3D Imaging. If SAE AS6171/13 is invoked in the contract, the base document, AS6171 General Requirements, shall also apply.

Acoustic Microscopy Test Methods for Counterfeit Capacitors